JPH0611510Y2 - 電圧印加電流測定装置 - Google Patents
電圧印加電流測定装置Info
- Publication number
- JPH0611510Y2 JPH0611510Y2 JP11227486U JP11227486U JPH0611510Y2 JP H0611510 Y2 JPH0611510 Y2 JP H0611510Y2 JP 11227486 U JP11227486 U JP 11227486U JP 11227486 U JP11227486 U JP 11227486U JP H0611510 Y2 JPH0611510 Y2 JP H0611510Y2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- current
- resistor
- subject
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 description 20
- 238000012360 testing method Methods 0.000 description 11
- 238000005259 measurement Methods 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000011990 functional testing Methods 0.000 description 3
- 239000000284 extract Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000000903 blocking effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000013641 positive control Substances 0.000 description 1
Landscapes
- Measurement Of Current Or Voltage (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11227486U JPH0611510Y2 (ja) | 1986-07-21 | 1986-07-21 | 電圧印加電流測定装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11227486U JPH0611510Y2 (ja) | 1986-07-21 | 1986-07-21 | 電圧印加電流測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6319280U JPS6319280U (en]) | 1988-02-08 |
JPH0611510Y2 true JPH0611510Y2 (ja) | 1994-03-23 |
Family
ID=30992993
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11227486U Expired - Lifetime JPH0611510Y2 (ja) | 1986-07-21 | 1986-07-21 | 電圧印加電流測定装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0611510Y2 (en]) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19782246B4 (de) * | 1997-11-20 | 2008-04-10 | Advantest Corp. | IC-Testgerät |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2336217B (en) * | 1997-12-02 | 2002-06-19 | Advantest Corp | Method of measuring current while applying a voltage and apparatus therefor |
JP4832200B2 (ja) * | 2006-07-18 | 2011-12-07 | 久元電子股▼ふん▲有限公司 | 集積回路のスタティックパラメータの測定装置 |
JP2009115506A (ja) * | 2007-11-02 | 2009-05-28 | Yokogawa Electric Corp | 直流試験装置及び半導体試験装置 |
-
1986
- 1986-07-21 JP JP11227486U patent/JPH0611510Y2/ja not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19782246B4 (de) * | 1997-11-20 | 2008-04-10 | Advantest Corp. | IC-Testgerät |
Also Published As
Publication number | Publication date |
---|---|
JPS6319280U (en]) | 1988-02-08 |
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